Fatima Florie May Silva, MS (she/her/hers)
Graduate Student
University of Georgia
Tifton, GA, USA
Albert K. Culbreath, PhD
Professor
University of Georgia
Tifton, Georgia, United States
Robert C. Kemerait, Jr., PhD
Professor
UGA Dept of Plant Pathology
Tifton, GA, USA
Mark Hopkins
University of Georgia
Athens, Georgia, United States
Emily Cantonwine, PhD
Professor
Valdosta State University
Valdosta, Georgia, United States
Corely Holbrook
USDA-ARS
Tifton, Georgia, United States
Enhancing resistance in peanut genotypes to early and late leaf spot diseases is crucial for improving crop resilience and productivity. This study evaluated peanut genotypes with introgressions from wild Arachis species for resistance to early and late leaf spot pathogens, Passaloraarachidicola and Nothopassalorapersonata, with a focus on both early and late stages of disease progression. The research investigates how these wild Arachis introgressions influence resistance and whether early-stage indicators provide insights comparable to traditional assessments.Field evaluations were conducted using the traditional Florida scale and leaf defoliation severity to measure late-stage disease progression. Additionally, early-stage parameters such as lesion incidence, days to sporulation, and sporulation degree were assessed.A strong correlation (R = 0.79) between the Florida scale and leaf defoliation severity emphasized its focus on late-stage disease. While, the lesion incidence showed a moderate correlation (R = 0.57) with the Florida scale, suggesting that resistance can be detected earlier in the disease cycle.Resistant genotypes exhibited significantly longer days to sporulation for late leaf spot (122–132 days) compared to early leaf spot (69–98 days) and significantly lower sporulation degrees for both diseases than susceptible lines (p < 0.001). These findings highlight the potential of these resistant genotypes in peanut breeding programs and suggest the need for further exploration and incorporation of early-stage parameters to enhance resistance assessments.